Technology ID
TAB-4573
Instant Total Internal Reflection Fluorescence/Structured Illumination Microscopy (instant TIRF/SIM)
E-Numbers
E-006-2016-0
Lead Inventor
Shroff, Hari (NIBIB)
Co-Inventors
Taraska, Justin (NHLBI)
Kumar, Abhishek
Guo, Min (NIBIB)
Applications
Research Materials
Development Stages
Pre-Clinical (in vitro)
Research Products
Research Equipment
Lead IC
NIBIB
ICs
NIBIB
NHLBI
This technology includes a method which enables high-speed, super-resolution microscopy at a very high signal-to-noise ratio (SNR), for biological applications within ~200 nm (the evanescent wave decay length) of a coverslip surface. Instant TIRF/SIM may be implemented simply by modifying and adding to the excitation optics that are already present within a conventional instant SIM design. We enforce TIRF excitation by removing all wave vectors that propagate into the objective lens at sub-critical angles.
Commercial Applications
High-speed, super-resolution microscopy.
Competitive Advantages
- Almost all other structured illumination microscopes require significant processing of the images, thus slowing acquisition down ~10-15-fold over this invention.
- Our previous instant SIM does not enable TIRF, and thus has lower SNR than this invention.
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