Technology ID
TAB-4573

Instant Total Internal Reflection Fluorescence/Structured Illumination Microscopy (instant TIRF/SIM)

E-Numbers
E-006-2016-0
Lead Inventor
Shroff, Hari (NIBIB)
Co-Inventors
Taraska, Justin (NHLBI)
Kumar, Abhishek
Guo, Min (NIBIB)
Applications
Research Materials
Development Stages
Pre-Clinical (in vitro)
Research Products
Research Equipment
Lead IC
NIBIB
ICs
NIBIB
NHLBI

This technology includes a method which enables high-speed, super-resolution microscopy at a very high signal-to-noise ratio (SNR), for biological applications within ~200 nm (the evanescent wave decay length) of a coverslip surface. Instant TIRF/SIM may be implemented simply by modifying and adding to the excitation optics that are already present within a conventional instant SIM design. We enforce TIRF excitation by removing all wave vectors that propagate into the objective lens at sub-critical angles.

Commercial Applications
High-speed, super-resolution microscopy.

Competitive Advantages
  • Almost all other structured illumination microscopes require significant processing of the images, thus slowing acquisition down ~10-15-fold over this invention.
  • Our previous instant SIM does not enable TIRF, and thus has lower SNR than this invention.

Request More Info

Licensing Contact:
Luna, Lunet
lunet.luna@nih.gov

Collaborations

  • Licensing

Collaboration Description

  • We are seeking statements of capability or interest from parties interested in collaborative research to further develop, evaluate, or commercialize this technology.
Date Published