Non-contact Total Emission Detection Methods and System For Multi-photon Microscopy
Technology
E-236-2009
Patent ID
E-236-2009-0-US-03
Country
US
Application Type
National Stage
Patent Status
Issued
Patent Number
8759792
Publication Number
US20130153788A1
Application Number
13/383,248
IC
NHLBI
Date Filed
Date Issued