SYSTEMS AND METHODS FOR MULTI-VIEW NONLINEAR OPTICAL IMAGING FOR IMPROVED SIGNAL-TO-NOISE RATIO AND RESOLUTION IN POINT SCANNING MULTI-PHOTON MICROSCOPY
Technology
E-229-2015
Patent ID
E-229-2015-0-US-04
Country
US
Application Type
National Stage
Patent Status
Issued
Patent Number
11041807
Publication Number
US-2020-0200681
Application Number
15/754,948
IC
NIBIB
Date Filed
Date Issued