Systems And Methods For Multiview Nonlinear Optical Imaging For Improved Signal-to-Noise Ratio And Resolution In Point Scanning Multi-Photon Microscopy
Technology
E-229-2015
Patent ID
E-229-2015-0-PCT-02
Country
PCT
Application Type
PCT
Patent Status
Expired
Patent Number
Publication Number
WO 2017/035078
Application Number
PCT/US2016/048058
IC
NIBIB
Date Filed
Date Issued
Patent PDF