Systems And Methods For Multiview Nonlinear Optical Imaging For Improved Signal-to-Noise Ratio And Resolution In Point Scanning Multi-Photon Microscopy
Technology
E-229-2015
Patent ID
E-229-2015-0-DE-06
Country
DE
Application Type
EP
Patent Status
Issued
Patent Number
Publication Number
3341710
Application Number
16839943.4
IC
NIBIB
Date Filed
Date Issued
Patent PDF